STMicroelectronics AN3107 ESD Immunity Optimization Application Note

This document presents the application of the VNI4140K quad-channel high-side driver and provides recommendations on how to optimize its ESD immunity level.


STMicroelectronics AN3107 ESD Immunity Optimization Application Note - cover page
Brand
STMicroelectronics
Document type
Application Note
Language
English
Pages
17
File format
PDF
File size
589 KB
Published
06 August, 2012
Updated
28 September, 2023
MD5 checksum
0184B2A535072CBAF1A5F8B6CC61EC25

About this manual

The document focuses on the VNI4140K, a quad-channel high-side driver designed for industrial applications. It addresses how to achieve required ESD immunity levels in accordance with IEC 61000-4-2 standards when using this specific device.

To optimize performance, the note details three application solutions involving external components: capacitive filters (C filters), IT LC filters, and dual LC filters. These configurations are intended to protect the device against radio-frequency disturbances and transient events.

What's inside

  • Introduction
  • Test setup according to IEC 61000-4-2
  • Cap filters
  • IT filters
  • Dual LC fillers
  • Conclusion

Frequently asked questions

What is the immunity level of the VNI4140K as stated in its datasheet?

The immunity level is 2000 V.

What are the test conditions for the ESD setup described?

The supply voltage is 24 VDC and inputs/outputs are OFF.

What type of inductor is recommended for the IT filter solution?

A wire-wound, air-core type inductor is recommended.

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