FAIRCHILD Semiconductor AN-7516 Application Note

Update: 30 September, 2023

This application note describes a test method for testing the safe operating area of power MOS transistors without a heat sink. The method does not use a heat sink, but relies on the thermal capacitance (CT) of the package to allow prediction of the case temperature during SOA testing.

Brand: Fairchild

File format: PDF

Size: 68 KB

MD5 Checksum: C74D0A3DD43A51E65F1ADA4708F9C2D9

Publication date: 12 July, 2012

Downloads: -

PDF Link: FAIRCHILD Semiconductor AN-7516 Application Note PDF

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