ST AN1232 handbook

Update: 28 September, 2023

This document describes the ruggedness improvement of RF DMOS devices, as well as the impedance mismatch issue between the output and load of RF power transistors. A theoretical model simulating the failure mode mechanism is proposed, and relevant corrective actions are undertaken.

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File format: PDF

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MD5 Checksum: 0F5972D9042F78258FE7E868BFBB16FC

Publication date: 06 August, 2012

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PDF Link: ST AN1232 handbook PDF