Agilent Scanning Microwave Microscopy Application Note

Update: 30 September, 2023

The Scanning Microwave Microscope Mode is a new scanning probe microscope (SPM) that combines the electromagnetic measurement capabilities of a microwave vector network analyzer (VNA) with the nanometer-resolution and Angstrom-scale positioning capabilities of an Atomic Force Microscope (AFM).

File format: PDF

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MD5 Checksum: 617AB661F6B69794C092EE11AA8CA55D

Publication date: 02 July, 2012

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PDF Link: Agilent Scanning Microwave Microscopy Application Note PDF

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