Agilent Determination of Trace Impurities in Copper by Axial ICP-OES Application Note

Update: 01 October, 2023

This document introduces a method for determining trace impurities in high-purity copper by sequential ICP-OES with axial viewing, which has high sensitivity and accuracy.

File format: PDF

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MD5 Checksum: A07B86DF4301AAEDC3A31C7E876ED9A3

Publication date: 12 June, 2012

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PDF Link: Agilent Determination of Trace Impurities in Copper by Axial ICP-OES Application Note PDF

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