TEXAS INSTRUMENTS SN54LVTH18512 SN54LVTH182512 SN74LVTH18512 SN74LVTH182512 handbook

Update: 28 September, 2023

This document describes the features and characteristics of models such as SN54LVTH18512, SN54LVTH182512, SN74LVTH18512, and SN74LVTH182512. These products are 3.3V ABT SCAN test devices with 18-bit universal bus transceivers. They support mixed-mode signal operation, compatible with 5V input and output voltages with 3.3V VCC. They can operate with unregulated battery down to 2.7V. The UBT (Universal Bus Transceiver) combines D-type latches and D-type flip-flops for operation in transparent, latched, or clocked mode. Bus hold on data inputs eliminates the need for external pullup/pulldown resistors. The B-port outputs of 'LVTH182512 devices have equivalent 25-Ω series resistors, so no external resistors are required. They are compatible with the IEEE Std 1149.1-1990 (JTAG) test access port and boundary-scan architecture. The SCOPE instruction set includes the required instructions and optional CLAMP and HIGHZ, supporting parallel-signature analysis at inputs, pseudo-random pattern generation from outputs, sample inputs/toggle outputs, binary count from outputs, device identification, and even-parity opcodes. Package options include 64-pin plastic thin shrink small outline (DGG) and 64-pin ceramic dual flat (HKC) packages using 0.5-mm center-to-center spacings.

Brand: TEXAS

File format: PDF

Size: 534 KB

MD5 Checksum: 2C62E1FD8F33BFC1B058418325035E19

Publication date: 07 June, 2012

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PDF Link: TEXAS INSTRUMENTS SN54LVTH18512 SN54LVTH182512 SN74LVTH18512 SN74LVTH182512 handbook PDF

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