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SN74LVT18502 SN74LVT182502 3.3-V ABT SCAN TEST DEVICES WITH 18-BIT UNIVERSAL BUS TRANSCEIVERS Manual
The SN74LVT18502 and SN74LVT182502 are 3.3‑V ABT scan test devices that belong to Texas Instruments' SCOPE™ testability family. They provide 18‑bit universal bus transceivers that can operate in transparent, latched, or clocked modes and support IEEE 1149.1‑1990 boundary‑scan.
The devices include an 8‑bit instruction register, four test‑data registers, and a 64‑pin Plastic Thin Quad Flat Package. They operate from –40 °C to 85 °C and feature bus‑hold circuitry, internal pull‑ups, and B‑port outputs capable of sourcing or sinking up to 12 mA.
Covers: Description · Functional Block Diagram · Terminal Functions · Test Architecture · State Diagram Description · Register Overview
Latest SN74LVT18502 manuals
SN74LVT18502 SN74LVT182502 3.3-V ABT SCAN TEST DEVICES WITH 18-BIT UNIVERSAL BUS TRANSCEIVERS Manual
Datasheet 34 pages · 476 KB · ENDatasheet for Texas Instruments SN74LVT18502 and SN74LVT182502 3.3‑V ABT scan test devices with 18‑bit universal bus transceivers.
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Datasheet
Ratings, dimensions and ordering codes, for selection and design work.
Questions answered in SN74LVT18502 manuals
Which pins are used for boundary‑scan testing?
Four dedicated test pins are used: TDI (test data input), TDO (test data output), TMS (test mode select), and TCK (test clock).
From: SN74LVT18502 SN74LVT182502 3.3-V ABT SCAN TEST DEVICES WITH 18-BIT UNIVERSAL BUS TRANSCEIVERS Manual
What is the default instruction after power‑up?
The instruction register resets to the binary value 10000001, which selects the IDCODE instruction.
From: SN74LVT18502 SN74LVT182502 3.3-V ABT SCAN TEST DEVICES WITH 18-BIT UNIVERSAL BUS TRANSCEIVERS Manual