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ReneSola Multi-Crystalline Silicon Wafer Specifications
This document provides the technical specifications for ReneSola multi‑crystalline silicon wafers. It includes physical dimensions, thickness tolerances, impurity concentrations, and defect limits for the wafers produced by Zhejiang Renesola Solar Energy Co., Ltd.
Key parameters such as wafer size (156 mm × 156 mm), thickness (180 µm ± 20 µm), carbon content, and allowable defect counts are listed, allowing manufacturers and engineers to assess suitability for photovoltaic module production. This manual is written in Chinese.
Covers: General Information · Physical Dimensions · Thickness Tolerances · Impurity Content · Electrical Properties · Defect Limits
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ReneSola Multi-Crystalline Silicon Wafer Specifications
Datasheet 1 pages · 247 KB · ZHTechnical specifications for ReneSola multi‑crystalline silicon wafers, covering dimensions, thickness, impurity levels and electrical properties.
Which document do I need?
Datasheet
Ratings, dimensions and ordering codes, for selection and design work.
Questions answered in ReneSola manuals
What is the carbon impurity level in the wafer?
The carbon content is 8 × 10⁷ atoms per cubic centimeter.
From: ReneSola Multi-Crystalline Silicon Wafer Specifications
How thick is the wafer and what is the allowed variation?
The wafer thickness is 180 µm ± 20 µm, with a total thickness variation of ±30 µm.
From: ReneSola Multi-Crystalline Silicon Wafer Specifications