SN54ABT18245A Manuals

SN54ABT18245A SN74ABT18245A SCAN TEST DEVICES WITH 18-BIT BUS TRANSCEIVERS Manual

The SN54ABT18245A and SN74ABT18245A are members of Texas Instruments' SCOPE™ testability family. They function as 18‑bit non‑inverting bus transceivers that can operate as two 9‑bit transceivers or a single 18‑bit transceiver. Data flow is controlled by DIR (direction) and OE (output‑enable) inputs, allowing bidirectional transfer between the A and B buses.

These devices support IEEE Standard 1149.1‑1990 boundary‑scan testing via a four‑wire TAP interface (TDI, TDO, TMS, TCK). In test mode, the normal bus operation is inhibited and the internal test circuitry can capture, shift, and update data registers, perform parallel‑signature analysis, and generate pseudo‑random patterns. The SN54ABT18245A is qualified for military temperature range 55 °C‑125 °C, while the SN74ABT18245A covers –40 °C‑85 °C.

Covers: Description · Functional Block Diagram · Terminal Functions · Test Architecture · State Diagram Description · Register Overview